| 6467051 |
Method and apparatus for selecting test point nodes of a group of components having both accessible and inaccessible nodes for limited access circuit test |
Rodney A. Browen, Cherif Ahrikencheikh, John E. McDermid, Kay C. Lannen |
2002-10-15 |
| 6334100 |
Method and apparatus for electronic circuit model correction |
Cherif Ahrikencheikh, Rodney A. Browen, Kay C. Lannen, John E. McDermid, Jamie P. Romero |
2001-12-25 |
| 6327545 |
Method and apparatus for board model correction |
Rodney A. Browen, Cherif Ahrikencheikh, John E. McDermid |
2001-12-04 |
| 6266787 |
Method and apparatus for selecting stimulus locations during limited access circuit test |
John E. McDermid, Cherif Ahrikencheikh, Rodney A. Browen, Kay C. Lannen |
2001-07-24 |
| 6263476 |
Method and apparatus for selecting targeted components in limited access test |
Rodney A. Browen, Cherif Ahrikencheikh, John E. McDermid, Kay C. Lannen |
2001-07-17 |
| 6237118 |
Method and apparatus for correcting for detector inaccuracies in limited access testing |
Cherif Ahrikencheikh, Rodney A. Browen, John E. McDermid |
2001-05-22 |
| 6233706 |
Method and apparatus for limited access circuit test |
Cherif Ahrikencheikh, Rodney A. Browen, John E. McDermid, Kay C. Lannen |
2001-05-15 |