| 12367324 |
Optimization of cross-sectional profile shapes for manufacture of structural parts |
Eric S. Lester, Venkata Narasimha Ravi Udali, Shobhit Rastogi, John Gilotti, John Henry Moselage, III |
2025-07-22 |
| 8605604 |
WLAN module test system |
Hsui-Ping Peng |
2013-12-10 |
| 8593203 |
High signal level compliant input/output circuits |
Vijay Shankar, Abheek Gupta, Vaishnav Srinivas |
2013-11-26 |
| 8184414 |
Method and apparatus for forming I/O clusters in integrated circuits |
Reza Jalilizeinali, Sreeker Dundigal, Thomas R. Toms |
2012-05-22 |
| 8138814 |
High signal level compliant input/output circuits |
Vijay Shankar, Abheek Gupta, Vaishnav Srinivas |
2012-03-20 |
| 8106699 |
High signal level compliant input/output circuits |
Vijay Shankar, Abheek Gupta, Vaishnav Srinivas |
2012-01-31 |
| 8063674 |
Multiple supply-voltage power-up/down detectors |
Chang Ki Kwon |
2011-11-22 |
| 8040645 |
System and method for excess voltage protection in a multi-die package |
Reza Jalilizeinali, Sreeker Dundigal |
2011-10-18 |
| 7843234 |
Break-before-make predriver and level-shifter |
Vaishnav Srinivas |
2010-11-30 |
| 7804334 |
High signal level compliant input/output circuits |
Vijay Shankar, Abheek Gupta, Vaishnav Srinivas |
2010-09-28 |
| 7772831 |
Systems and methods for testing packaged dies |
Tauseef Kazi, Jeff Gemar, Vaishnav Srinivas |
2010-08-10 |
| 7772887 |
High signal level compliant input/output circuits |
Vijay Shankar, Abheek Gupta, Vaishnav Srinivas |
2010-08-10 |
| 7768299 |
Voltage tolerant floating N-well circuit |
Abheek Gupta, Vaishnav Srinivas |
2010-08-03 |
| 7724485 |
N-channel ESD clamp with improved performance |
Eugene R. Worley, Reza Jalilizeinali |
2010-05-25 |
| 7692565 |
Systems and methods for performing off-chip data communications at a high data rate |
Abhay Dixit |
2010-04-06 |
| 7656743 |
Clock signal generation techniques for memories that do not generate a strobe |
Vaishnav Srinivas, Sanat Kapoor, Srinivas Maddali |
2010-02-02 |
| 7605618 |
Digital output driver and input buffer using thin-oxide field effect transistors |
Vaishnav Srinivas |
2009-10-20 |
| 7471110 |
Current mode interface for off-chip high speed communication |
Abhay Dixit, Mehdi Hamidi Sani |
2008-12-30 |
| 7075175 |
Systems and methods for testing packaged dies |
Tauseef Kazi, Jeff Gemar, Vaishnav Srinivas |
2006-07-11 |