UN

Uday Nayak

EL Electroglas: 4 patents #6 of 34Top 20%
FO Formfactor: 3 patents #53 of 177Top 30%
NI Nikon: 1 patents #1,647 of 2,493Top 70%
NP Nikon Precision: 1 patents #18 of 34Top 55%
NA Nikon Research Corporation Of America: 1 patents #8 of 29Top 30%
Overall (All Time): #385,396 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8519728 Compliance control methods and apparatuses Sun Yalei 2013-08-27
8310195 Method for improving motion times of a stage Sun Yalei, Richard J. Casler, Jr., Thomas Rohrs 2012-11-13
8120304 Method for improving motion times of a stage Sun Yalei, Richard J. Casler, Jr., Thomas Rohrs 2012-02-21
7852097 Methods and apparatuses for improved positioning in a probing system Xiaolan Zhang, George Asmerom, Max Jedda 2010-12-14
7622939 Methods and apparatuses for improved stabilization in a probing system Richard J. Casler, Jr., Max Jedda 2009-11-24
7368929 Methods and apparatuses for improved positioning in a probing system Xiaolan Zhang, George Asmerom, Max Jedda 2008-05-06
7362116 Method for probing impact sensitive and thin layered substrate Sun Ya Lei, Lynn Howard Whitney 2008-04-22
7352198 Methods and apparatuses for improved stabilization in a probing system Richard J. Casler, Jr., Max Jedda 2008-04-01
7345466 Method and apparatus for cleaning a probe card Michael Vogtmann, Rolf Hagenlocher 2008-03-18
6363809 Precision scanning apparatus and method with fixed and movable guide members W. Thomas Novak, Zahirudeen Premji, Akimitsu Ebihara 2002-04-02
6134981 Precision scanning apparatus and method with fixed and movable guide members W. Thomas Novak, Zahirudeen Premji, Akimitsu Ebihara 2000-10-24
5996437 Precision motion stage with single guide beam and follower stage W. Thomas Novak, Zahirudeen Premji, Akimitsu Ebihara 1999-12-07
5623853 Precision motion stage with single guide beam and follower stage W. Thomas Novak, Zahirudeen Premji, Akimitsu Ebihara 1997-04-29