TD

Todd A. Dobson

Micron: 8 patents #1,691 of 6,345Top 30%
Overall (All Time): #656,208 of 4,157,543Top 20%
8
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8053371 Apparatus and methods for selective removal of material from wafer alignment marks Russell C. Zahorik, Guy F. Hudson, Hugh E. Stroupe, Brian F. Gordon 2011-11-08
7244681 Methods for selective removal of material from wafer alignment marks Guy F. Hudson, Hugh E. Stroupe, Brian F. Gordon, Russell C. Zahorik 2007-07-17
6889698 Apparatus for selective removal of material from wafer alignment marks Russell C. Zahorik, Guy F. Hudson, Hugh E. Stroupe, Brian F. Gordon 2005-05-10
6610610 Methods for selective removal of material from wafer alignment marks Russell C. Zahorik, Guy F. Hudson, Hugh E. Stroupe, Brian F. Gordon 2003-08-26
6530113 Apparatus for selective removal of material from wafer alignment marks Russell C. Zahorik, Guy F. Hudson, Hugh E. Stroupe, Brian F. Gordon 2003-03-11
6447634 Method and apparatus for selective removal of material from wafer alignment marks Russell C. Zahorik, Guy F. Hudson, Hugh Stroupe, Brian F. Gordon 2002-09-10
6329301 Method and apparatus for selective removal of material from wafer alignment marks Russell C. Zahorik, Guy F. Hudson, Hugh E. Stroupe, Brian F. Gordon 2001-12-11
6103636 Method and apparatus for selective removal of material from wafer alignment marks Russell C. Zahorik, Guy F. Hudson, Hugh E. Stroupe, Brian F. Gordon 2000-08-15