Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161994 | Systems and methods for electrically testing electromigration in an electromigration test structure | Brent Dale Harry, Eric Wilcox, James J. Donlin | 2018-12-25 |
| 10060963 | Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges | Jeffery Allan Shepler, Clint Vander Giessen | 2018-08-28 |
| 6097200 | Modular, semiconductor reliability test system | Venu Turlapaty, Brent Dale Harry, Richard BENJAMIN | 2000-08-01 |