Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10161994 | Systems and methods for electrically testing electromigration in an electromigration test structure | Timothy Allen McMullen, Eric Wilcox, James J. Donlin | 2018-12-25 |
| 6097200 | Modular, semiconductor reliability test system | Venu Turlapaty, Timothy Allen McMullen, Richard BENJAMIN | 2000-08-01 |