Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10060963 | Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges | Timothy Allen McMullen, Jeffery Allan Shepler | 2018-08-28 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10060963 | Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges | Timothy Allen McMullen, Jeffery Allan Shepler | 2018-08-28 |