| 10119991 |
Vertical probe device and supporter used in the same |
Tsung-Yi Chen, Horng-Kuang Fan, Ching-Hung Yang, Chung-Tse Lee, Chia-Yuan Kuo +2 more |
2018-11-06 |
| 10041974 |
Probe head of vertical probe card |
Yi-Ching Chuo |
2018-08-07 |
| 9857393 |
Testing device and assembling method thereof |
Chin-Yi Lin, Ching-Hung Yang |
2018-01-02 |
| 9823272 |
Wafer testing probe card |
Ming-Chi Chen, Dai-Jin Yeh, Tsung-Yi Chen, Chien-Kuei Wang |
2017-11-21 |
| 9638716 |
Positioner of probe card and probe head of probe card |
Tzu-Yang Chen, Shang-Jung Hsieh, Chung-Tse Lee, Tsung-Yi Chen, Chia-Yuan Kuo +1 more |
2017-05-02 |
| 9618536 |
Probe needle and probe module using the same |
Chia-Yuan Kuo, Ming-Chi Chen, Chien-Chou Wu, Tsung-Yi Chen |
2017-04-11 |
| 9588141 |
Probe device having spring probe |
Tsung-Yi Chen, Chien-Chou Wu, Ting-Hsin KUO |
2017-03-07 |
| 9535092 |
Spring probe |
Ting-Hsin KUO, Tsung-Yi Chen, Yi-Lung Lee, Chien-Chou Wu |
2017-01-03 |
| 9465050 |
Assembling method and maintaining method for vertical probe device |
Tsung-Yi Chen, Horng-Kuang Fan, Ching-Hung Yang, Chung-Tse Lee, Chia-Yuan Kuo +1 more |
2016-10-11 |