Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9464992 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Mark Harless, Cory Watkins | 2016-10-11 |
| 9337071 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Mark Harless, Cory Watkins | 2016-05-10 |
| 7729528 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Mark Harless, Cory Watkins | 2010-06-01 |
| 6937753 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Mark Harless, Steve Herrmann | 2005-08-30 |
| 6826298 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Mark Harless, Cory Watkins | 2004-11-30 |
| 6324298 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Mark Harless | 2001-11-27 |