Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5986760 | Shape measurement method and high-precision lens manufacturing process | Shigeru Nakayama, Takashi Genma, Masami Ebi, Hajime Ichikawa | 1999-11-16 |
| 5929438 | Cantilever and measuring apparatus using it | Yoshihiko Suzuki, Miyuki Niikura | 1999-07-27 |
| 5656769 | Scanning probe microscope | Katsushi Nakano | 1997-08-12 |
| 5508517 | Scanning probe type microscope apparatus | Masatoshi Suzuki, Toru Fujii, Hiroyuki Matsushiro, Hideaki Ohkubo | 1996-04-16 |
| 5360977 | Compound type microscope | Masatoshi Suzuki, Hiroyuki Matsushiro | 1994-11-01 |
| 5317153 | Scanning probe microscope | Hiroyuki Matsushiro, Masaya Miyazaki, Yasushi Fukutomi | 1994-05-31 |