Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6963408 | Method and apparatus for point diffraction interferometry | Mikihiko Ishii, Hisashi Shiozawa, Jun Kawakami, Yutaka Ichihara | 2005-11-08 |
| 5317153 | Scanning probe microscope | Hiroyuki Matsushiro, Tetsuji Onuki, Masaya Miyazaki | 1994-05-31 |