Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8597584 | Gas purifying process and device | Tadahiro Ohmi, Ryuichi Yazaki, Masato Kawai, Kunio Matsuda | 2013-12-03 |
| 7744836 | Gas purifying process and device | Tadahiro Ohmi, Ryuichi Yazaki, Masato Kawai, Kunio Matsuda | 2010-06-29 |
| 6857324 | Method and apparatus for measuring concentrations of components of fluid | Tetsuya Sato, Shang-Qian Wu | 2005-02-22 |
| 6823743 | Method and apparatus for measuring concentrations of components of fluid | Tetsuya Sato, Shang-Qian Wu | 2004-11-30 |
| 6717666 | Method and apparatus for measuring nitrogen in a gas | Tetsuya Satou, Shang-Qian Wu | 2004-04-06 |
| 6605134 | Method and apparatus for collecting rare gas | Yoshio Ishihara, Shigeru Hayashida, Toru Nagasaka, Tadahiro Ohmi | 2003-08-12 |
| 6550308 | Gas analyzing apparatus | Tsutomu Kikuchi, Akira Nishina | 2003-04-22 |
| 6478040 | Gas supplying apparatus and gas substitution method | Tsutomu Kikuchi, Tetsuya Satou, Akira Nishina | 2002-11-12 |
| 6418781 | System for analyzing trace amounts of impurities in gases | Akira Nishina, Tsutomu Kikuchi, Makoto Tanaka, Hidetoshi Yoshida | 2002-07-16 |
| 6397660 | Gas analyzing apparatus | Tsutomu Kikuchi, Akira Nishina | 2002-06-04 |
| 6375911 | Method and device for treating exhaust gas | Tadahiro Ohmi, Yoshio Ishihara, Koh Matsumoto | 2002-04-23 |
| 6324892 | Multi-gas analysis system for analyzing high-purity gases | Akira Nishina, Tsutomu Kikuchi, Makoto Tanaka, Hidetoshi Yoshida | 2001-12-04 |
| 6040915 | Analysis method for gases and apparatus therefor | Shang-Qian Wu, Jun-ichi Morishita, Yoshio Ishihara | 2000-03-21 |
| 6000275 | Method for analyzing impurities in gas and its analyzer | Akira Nishina, Hitomi Umehara | 1999-12-14 |