Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6653144 | Method and an apparatus for analyzing trace impurities in gases | Tetsuya Satou | 2003-11-25 |
| 6550308 | Gas analyzing apparatus | Tsutomu Kikuchi, Tetsuya Kimijima | 2003-04-22 |
| 6523567 | Apparatus and process for supplying gas | Tetsuya Satou, Tsutomu Kikuchi | 2003-02-25 |
| 6478040 | Gas supplying apparatus and gas substitution method | Tsutomu Kikuchi, Tetsuya Satou, Tetsuya Kimijima | 2002-11-12 |
| 6474136 | Method and apparatus for analyzing impurities in gases | Makoto Tanaka, Tetsuya Satou | 2002-11-05 |
| 6418781 | System for analyzing trace amounts of impurities in gases | Tsutomu Kikuchi, Makoto Tanaka, Hidetoshi Yoshida, Tetsuya Kimijima | 2002-07-16 |
| 6397660 | Gas analyzing apparatus | Tsutomu Kikuchi, Tetsuya Kimijima | 2002-06-04 |
| 6324892 | Multi-gas analysis system for analyzing high-purity gases | Tsutomu Kikuchi, Makoto Tanaka, Hidetoshi Yoshida, Tetsuya Kimijima | 2001-12-04 |
| 6000275 | Method for analyzing impurities in gas and its analyzer | Hitomi Umehara, Tetsuya Kimijima | 1999-12-14 |