Tessema Kebede

IBM: 1 patents #44,794 of 70,183Top 65%

📍 Peekskill, NY: #157 of 232 inventorsTop 70%

🗺 New York: #67,335 of 115,490 inventorsTop 60%

Overall (All Time): #3,661,907 of 4,157,543Top 90%

Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #	Title	Co-Inventors	Date
5959459	Defect monitor and method for automated contactless inline wafer inspection	Akella V. S. Satya, Leon Ray Bentson	1999-09-28