Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5959459 | Defect monitor and method for automated contactless inline wafer inspection | Akella V. S. Satya, Tessema Kebede | 1999-09-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5959459 | Defect monitor and method for automated contactless inline wafer inspection | Akella V. S. Satya, Tessema Kebede | 1999-09-28 |