Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5959459 | Defect monitor and method for automated contactless inline wafer inspection | Tessema Kebede, Leon Ray Bentson | 1999-09-28 |
| 4450559 | Memory system with selective assignment of spare locations | George L. Bond | 1984-05-22 |
| 4196389 | Test site for a charged coupled device (CCD) array | Helen J. Kelly, David J. Perlman | 1980-04-01 |