Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8689359 | Apparatus and method for investigating surface properties of different materials | Ivo Rangelow, Tzvetan Ivanov, Burkhard Volland, Miroslaw Woszczyna, Jerzy Mielczarski +1 more | 2014-04-01 |
| 8056402 | Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques | Michael Hecker, Ehrenfried Zschech, Piotr Grabiec, Pawel Janus | 2011-11-15 |