Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400820 | Field emission electron source, electron optical device, and manufacturing method | Takeshi Kawasaki | 2025-08-26 |
| 11011344 | Interferometric electron microscope | Toshiaki Tanigaki, Ken Harada | 2021-05-18 |
| 10872743 | Sample holding mechanism, manufacturing method for same, and charged particle beam device | Akira Sugawara, Yoshio Takahashi, Toshiaki Tanigaki | 2020-12-22 |
| 10629410 | Electron microscope for magnetic field measurement and magnetic field measurement method | Toshiaki Tanigaki, Akira Sugawara | 2020-04-21 |
| 7872755 | Interferometer | Ken Harada, Yoshihiko Togawa, Tsuyoshi Matsuda, Noboru Moriya | 2011-01-18 |
| 7816648 | Electron interferometer or electron microscope | Ken Harada, Yoshihiko Togawa, Tsuyoshi Matsuda | 2010-10-19 |
| 7750298 | Interferometer having three electron biprisms | Ken Harada, Yoshihiko Togawa, Tsuyoshi Matsuda, Noboru Moriya | 2010-07-06 |
| 7655905 | Charged particle beam equipment | Ken Harada, Yoshihiko Togawa, Tsuyoshi Matsuda, Noboru Moriya | 2010-02-02 |
| 7538323 | Interferometer | Ken Harada, Yoshihiko Togawa, Tsuyoshi Matsuda, Noboru Moriya | 2009-05-26 |