| 12266418 |
Memory device having row driver circuits for reducing leakage currents during power off |
Youngjin Yoon, Kwang Kyung Lee, Seung Cheol Bae, Kangmin Lee, Sangmin Jun |
2025-04-01 |
| 12260930 |
Memory core characteristic screening method and system thereof |
Jeong-Ho Bang, Hyeon Jae Lee, Wol-Jin Lee, Ki Hyung Ryoo, Kwang-Rae Cho |
2025-03-25 |
| 12237669 |
Semiconductor integrated circuit |
Kang-min Lee, Kwang Kyung Lee, Seung Cheol Bae, Young-Jin Yoon, Sang Min Jun |
2025-02-25 |
| 12183411 |
Memory interface circuitry and built-in self-testing method |
Hyeon Jae Lee, Jeong-Ho Bang, Wol-Jin Lee, Ki Hyung Ryoo, Kwang-Rae Cho |
2024-12-31 |
| 12119041 |
Signal synchronization adjustment method and signal synchronization adjustment circuit |
Sang Min Jun, Kwang Kyung Lee, Seung Cheol Bae, Kang-min Lee, Young-Jin Yoon |
2024-10-15 |
| 11115006 |
Internal latch circuit and method for generating latch signal thereof |
Kangmin Lee, Sangmin Jun, Youngjin Yoon, Seung Cheol Bae, Kwang Kyung Lee |
2021-09-07 |
| 6141271 |
Circuits for testing memory devices having direct access test mode and methods for testing the same |
Kye-hyun Kyung |
2000-10-31 |
| 6072747 |
High-speed current setting systems and methods for integrated circuit output drivers |
— |
2000-06-06 |
