SC

Sung Soo Chung

CI Cisco: 10 patents #1,401 of 13,007Top 15%
AT Ace Technologies: 3 patents #11 of 86Top 15%
SF Seoul National University Industry Foundation: 1 patents #226 of 804Top 30%
Overall (All Time): #275,381 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10505244 RF cavity filter using elastic element and method for manufacturing the same Gwan Young Koo, Jin Yang Kim, Se Young O, Seong Min Lee, Sin Jae Kim +2 more 2019-12-10
10084222 RF filter for improving PIMD performance Dong-Wan Chun, Jung Geun PARK 2018-09-25
9397377 Cavity filter Jae-Ok Seo, Jung-Hak Ahn, Dong-Wan Chun, Kwang-Sun Park 2016-07-19
9316691 Method and apparatus for fault injection 2016-04-19
8578226 Apparatus and system for implementing variable speed scan testing 2013-11-05
8386866 Methods for implementing variable speed scan testing 2013-02-26
7673202 Single event upset test circuit and methodology 2010-03-02
7536617 Programmable in-situ delay fault test clock generator Hong-Shin Jun, Heong Jin Kim 2009-05-19
7487412 Test buffer design and interface mechanism for differential receiver AC/DC boundary scan test Sang Hyeon Baeg 2009-02-03
7351433 Method for producing polymeric sol of calcium phosphate compound and method for coating the same on a metal implant Hyun Seung Yu, Dong Soo Lee, Kug Sun Hong, Choon Ki Lee, Jae Lee +3 more 2008-04-01
7269770 AC coupled line testing using boundary scan test methodology Sang Hyeon Baeg 2007-09-11
7174492 AC coupled line testing using boundary scan test methodology Sang Hyeon Baeg 2007-02-06
7089470 Programmable test pattern and capture mechanism for boundary scan Sang Hyeon Baeg, Hongshin Jun 2006-08-08
7089463 Test buffer design and interface mechanism for differential receiver AC/DC boundary scan test Sang Hyeon Baeg 2006-08-08
6934921 Resolving LBIST timing violations Xinli Gu, Frank Tjoeng Tsang 2005-08-23
6560739 Mechanism for enabling compliance with the IEEE standard 1149.1 for boundary-scan designs and tests 2003-05-06
6446230 Mechanism for enabling compliance with the IEEE standard 1149.1 for boundary-scan designs and tests 2002-09-03