Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8856704 | Layout library of flip-flop circuit | — | 2014-10-07 |
| 8664971 | Method of testing functioning of a semiconductor device | — | 2014-03-04 |
| 7487412 | Test buffer design and interface mechanism for differential receiver AC/DC boundary scan test | Sung Soo Chung | 2009-02-03 |
| 7269770 | AC coupled line testing using boundary scan test methodology | Sung Soo Chung | 2007-09-11 |
| 7174492 | AC coupled line testing using boundary scan test methodology | Sung Soo Chung | 2007-02-06 |
| 7089463 | Test buffer design and interface mechanism for differential receiver AC/DC boundary scan test | Sung Soo Chung | 2006-08-08 |
| 7089470 | Programmable test pattern and capture mechanism for boundary scan | Sung Soo Chung, Hongshin Jun | 2006-08-08 |
| 6019502 | Test circuits and methods for built-in testing integrated devices | Seong-Won Lee | 2000-02-01 |
| 5754758 | Serial memory interface using interlaced scan | Heon Cheol Kim, Ho-royng Kim, Chang-Hyun Cho | 1998-05-19 |
| 5706293 | Method of testing single-order address memory | Heon Cheol Kim, Ho Ryong KIM, Chang-Hyun Cho | 1998-01-06 |