Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7844875 | Programmable test clock generation responsive to clock signal characterization | Zhiyuan Wang, Xinli Gu | 2010-11-30 |
| 7536617 | Programmable in-situ delay fault test clock generator | Sung Soo Chung, Heong Jin Kim | 2009-05-19 |
| 6742151 | Semiconductor integrated circuit device with scan signal converting circuit | Hee Min PARK | 2004-05-25 |
| 6658611 | Programmable built-in self-test system for semiconductor memory device | — | 2003-12-02 |
| 6603691 | SEMICONDUCTOR DEVICE INCLUDING BUILT-IN REDUNDANCY ANALYSIS CIRCUIT FOR SIMULTANEOUSLY TESTING AND ANALYZING FAILURE OF A PLURALITY OF MEMORIES AND METHOD FOR ANALYZING THE FAILURE OF THE PLURALITY OF MEMORIES | Young-Doo Yoo | 2003-08-05 |
| 6148426 | Apparatus and method for generating addresses in a SRAM built-in self test circuit using a single-direction counter | Heon Cheol Kim | 2000-11-14 |
| 5946246 | Semiconductor memory device with built-in self test circuit | Chang-Hyun Cho | 1999-08-31 |