Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6479386 | Process for reducing surface variations for polished wafer | Kan-Yin Ng, Yun-Biao Xin, Henry F. Erk, Darrel Harris, James Jose +3 more | 2002-11-12 |
| 6227944 | Method for processing a semiconductor wafer | Yun-Biao Xin, Ichiro Yoshimura, Henry F. Erk, Ralph V. Vogelgesang | 2001-05-08 |