Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7494893 | Identifying yield-relevant process parameters in integrated circuit device fabrication processes | Anand Inani, Brian E. Stine, Marci Liao, Senthil Arthanari, Michael Williamson +1 more | 2009-02-24 |
| 7415386 | Method and system for failure signal detection analysis | Richard Burch, Paul Lin, Eric Antonissen | 2008-08-19 |