Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11226353 | Integrated cable probe design for high bandwidth RF testing | Chengqing Hu, Mayue Xie, Deepak Goyal | 2022-01-18 |
| 10746780 | High power terahertz impulse for fault isolation | Mayue Xie, Hemachandar Tanukonda Devarajulu, Deepak Goyal, Zhiguo Qian | 2020-08-18 |