Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12366542 | Nondestructive inspection system | Satoshi Yanobe, Akira Yajima, Hanako AIKOH, Satoru ISHIGURO, Yoshie OTAKE +2 more | 2025-07-22 |
| 11754516 | Nondestructive test system comprising a neutron emission unit for emitting fast neutrons and a neutron detection unit for detecting thermal neutrons, and nondestructive test method | Hisashi Tsukada, Yoshie OTAKE, Hideyuki Sunaga, Yuichi Yoshimura, Koji Ikado | 2023-09-12 |
| 11747288 | Non-destructive inspection system comprising neutron radiation source and neutron radiation method | Hisashi Tsukada, Yoshie OTAKE, Koji Ikado, Yuichi Yoshimura, Hideyuki Sunaga | 2023-09-05 |
| 11614415 | Nondestructive testing system and nondestructive testing method | Satoru ISHIGURO, Yoshie OTAKE, Hideyuki Sunaga, Yuichi Yoshimura, Koji Ikado | 2023-03-28 |
| 11513084 | Nondestructive inspecting system, and nondestructive inspecting method | Hanako AIKOH, Yoshie OTAKE, Yuichi Yoshimura, Hideyuki Sunaga | 2022-11-29 |
| 9995826 | Electronic distance meter | Yasushi Tanaka, Kenichiro Yoshino | 2018-06-12 |
| 9709676 | Laser light emitting device having a mode scrambler for unifying light intensity distribution | Taizo Eno, Ken-ichiro Yoshino | 2017-07-18 |
| 7561768 | Optical branching device | Akira Takada, Shinya Ikoma | 2009-07-14 |
| 7309168 | Optical fiber cable | Masayuki Momiuchi, Shinya Ikoma, Akira Takada | 2007-12-18 |
| 6233370 | Interference measurement apparatus and probe used for interference measurement apparatus | Makoto Fujino, Nobuo Hori | 2001-05-15 |
| 6166818 | Interference measurement apparatus, interference measurement probe and interference measurement control system | Nobuo Hori, Makoto Fujino | 2000-12-26 |
| 6075600 | Signal formation apparatus for use in interference measurement | Makoto Fujino, Akira Takada, Nobuo Hori | 2000-06-13 |
| 5349431 | Apparatus for measuring cross-sectional distribution of refractive index of optical waveguide | Nicolas Gisin, Patrick Stamp, Rogerio Passy, Nobuo Hori | 1994-09-20 |
| 5337169 | Method for patterning an optical device for optical IC, and an optical device for optical IC fabricated by this method | Nobuo Hori, Yoshinobu Takano, Takashi Takahashi, Reiji Hashimoto | 1994-08-09 |