Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6598185 | Pattern data inspection method and storage medium | Katsuji Tabara, Kazuhiko Takahashi, Kunihiko Shiozawa, Yoshiharu Ootani, Syuzi Katase | 2003-07-22 |
| 6064484 | Pattern inspection method and system | Ken Kobayashi, Takayoshi Matsuyama | 2000-05-16 |
| 4673816 | Method for inspecting a pattern and an apparatus for inspecting a pattern | Kenichi Kobayashi | 1987-06-16 |