Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6598185 | Pattern data inspection method and storage medium | Showgo Matsui, Katsuji Tabara, Kazuhiko Takahashi, Yoshiharu Ootani, Syuzi Katase | 2003-07-22 |
| 4774461 | System for inspecting exposure pattern data of semiconductor integrated circuit device | Shogo Matsui, Kenichi Kobayashi | 1988-09-27 |