Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7486814 | Local bias map using line width measurements | Yair Eran, Gad Greenberg, Ami Sade | 2009-02-03 |
| 7133549 | Local bias map using line width measurements | Yair Eran, Gad Greenberg, Ami Sade | 2006-11-07 |
| 7072502 | Alternating phase-shift mask inspection method and apparatus | Alex Goldenshtein, Gadi Greenberg, Mula Friedman, Boaz Kenan | 2006-07-04 |