Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6677585 | Scanning charged particle microscope, and focal distance adjusting method and astigmatism correction method thereof | — | 2004-01-13 |
| 5770861 | Apparatus for working a specimen | Hiroshi Hirose | 1998-06-23 |
| 5012109 | Charged particle beam apparatus | Hiroyasu Shichi, Eisuke Mitani | 1991-04-30 |
| 4698503 | Focusing apparatus used in a transmission electron microscope | Morioki Kubozoe, Shigeto Isakozawa | 1987-10-06 |
| 4680469 | Focusing device for a television electron microscope | Shigeto Isakozawa | 1987-07-14 |
| 4532422 | Electron holography microscope | Akira Tonomura, Nobuo Hamamoto, Akira Fukuhara | 1985-07-30 |
| 4344011 | X-ray tubes | Tadashi Hayashi | 1982-08-10 |