Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10393672 | System and method of inspecting substrate and method of fabricating semiconductor device using the same | Jeongho Ahn, Jae-Man Oh, Yusin Yang, Dongchul Ihm, Hyungsuk Cho | 2019-08-27 |
| 10067067 | Substrate inspection apparatus | Jeongho Ahn | 2018-09-04 |