Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7494893 | Identifying yield-relevant process parameters in integrated circuit device fabrication processes | Anand Inani, Brian E. Stine, Marci Liao, Michael Williamson, Spencer B. Graves +1 more | 2009-02-24 |
| 6559033 | Processing for forming integrated circuit structure with low dielectric constant material between closely spaced apart metal lines | John Hu, Kai Zhang, Hong-Qiang Lu | 2003-05-06 |