Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5985494 | Metrological structures particularly for direct measurement of errors introduced by alignment systems | Paolo Canestrari, Giovanni Rivera | 1999-11-16 |
| 5622796 | Process for producing metrological structures particularly for direct measurement of errors introduced by alignment systems | Paolo Canestrari, Giovanni Rivera | 1997-04-22 |