Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12211194 | Defect inspection with images of different synthesis ratios | Yasushi Ebizuka, Hiroyuki Shindo | 2025-01-28 |
| 11448663 | Pattern height information correction system and pattern height information correction method | Kenji Yamasaki, Hiroyuki Shindo, Taeko Kashiwa | 2022-09-20 |