| 9746516 |
Collecting diagnostic data from chips |
Steven M. Douskey, William V. Huott, Mary P. Kusko |
2017-08-29 |
| 9568549 |
Managing redundancy repair using boundary scans |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2017-02-14 |
| 9372232 |
Collecting diagnostic data from chips |
Steven M. Douskey, William V. Huott, Mary P. Kusko |
2016-06-21 |
| 9366723 |
Test coverage of integrated circuits with masking pattern selection |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2016-06-14 |
| 9285423 |
Managing chip testing data |
Steven M. Douskey, William V. Huott, Mary P. Kusko |
2016-03-15 |
| 9201117 |
Managing redundancy repair using boundary scans |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2015-12-01 |
| 9188636 |
Self evaluation of system on a chip with multiple cores |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2015-11-17 |
| 9116205 |
Test coverage of integrated circuits with test vector input spreading |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2015-08-25 |
| 9103879 |
Test coverage of integrated circuits with test vector input spreading |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2015-08-11 |
| 9069041 |
Self evaluation of system on a chip with multiple cores |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2015-06-30 |
| 9032256 |
Multi-core processor comparison encoding |
Steven M. Douskey, Michael J. Hamilton, Dennis Martin Rickert |
2015-05-12 |
| 9003244 |
Dynamic built-in self-test system |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2015-04-07 |
| 8898530 |
Dynamic built-in self-test system |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2014-11-25 |
| 8856720 |
Test coverage of integrated circuits with masking pattern selection |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2014-10-07 |
| 8762803 |
Implementing enhanced pseudo random pattern generators with hierarchical linear feedback shift registers (LFSRs) |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2014-06-24 |
| 8667431 |
Test coverage of integrated circuits with masking pattern selection |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2014-03-04 |
| 8627162 |
Iimplementing enhanced aperture function calibration for logic built in self test (LBIST) |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2014-01-07 |
| 8516318 |
Dynamic scan |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2013-08-20 |
| 8407542 |
Implementing switching factor reduction in LBIST |
Steven M. Douskey, Michael J. Hamilton, Amanda R. Kaufer |
2013-03-26 |
| 7830195 |
Self-test design methodology and technique for root-gated clocking structure |
Steven M. Douskey, Brandon E. Schenck |
2010-11-09 |
