Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9892503 | Monitoring changes in photomask defectivity | Chun Guan, Yalin Xiong, Joseph M. Blecher, Mark J. Wihl | 2018-02-13 |
| 9518935 | Monitoring changes in photomask defectivity | Chun Guan, Yalin Xiong, Joseph M. Blecher, Mark J. Wihl | 2016-12-13 |