RD

Richard Lee Donze

IBM: 12 patents #9,222 of 70,183Top 15%
📍 Rochester, MN: #483 of 3,042 inventorsTop 20%
🗺 Minnesota: #6,285 of 52,454 inventorsTop 15%
Overall (All Time): #423,919 of 4,157,543Top 15%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
7935629 Semiconductor scheme for reduced circuit area in a simplified process Todd A. Christensen, William Paul Hovis, Terrance Wayne Kueper, John E. Sheets, II 2011-05-03
7696565 FinFET body contact structure Karl R. Erickson, William Paul Hovis, Terrance Wayne Kueper, John E. Sheets, II, Jon Robert Tetzloff 2010-04-13
7659733 Electrical open/short contact alignment structure for active region vs. gate region Karl R. Erickson, William Paul Hovis, John Edward Sheet, II, Jon Robert Tetzloff 2010-02-09
7626220 Semiconductor scheme for reduced circuit area in a simplified process Todd A. Christensen, William Paul Hovis, Terrance Wayne Kueper, John E. Sheets, II 2009-12-01
7453272 Electrical open/short contact alignment structure for active region vs. gate region Karl R. Erickson, William Paul Hovis, John E. Sheets, II, Jon Robert Tetzloff 2008-11-18
7336086 Measurement of bias of a silicon area using bridging vertices on polysilicon shapes to create an electrical open/short contact structure Karl R. Erickson, William Paul Hovis, John E. Sheets, II, Jon Robert Tetzloff 2008-02-26
7317605 Method and apparatus for improving performance margin in logic paths William Paul Hovis, Terrance Wayne Kueper, John E. Sheets, II, Jon Robert Tetzloff 2008-01-08
7317217 Semiconductor scheme for reduced circuit area in a simplified process Todd A. Christensen, William Paul Hovis, Terrance Wayne Kueper, John E. Sheets, II 2008-01-08
7241649 FinFET body contact structure Karl R. Erickson, William Paul Hovis, Terrance Wayne Kueper, John E. Sheets, II, Jon Robert Tetzloff 2007-07-10
7227183 Polysilicon conductor width measurement for 3-dimensional FETs William Paul Hovis, Terrance Wayne Kueper, John E. Sheets, II, Jon Robert Tetzloff 2007-06-05
7183780 Electrical open/short contact alignment structure for active region vs. gate region Karl R. Erickson, William Paul Hovis, John E. Sheets, II, Jon Robert Tetzloff 2007-02-27
6466626 Driver with in-situ variable compensation for cable attenuation Delbert R. Cecchi 2002-10-15