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Method and apparatus for identifying and reducing spurious frequency components |
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2013-04-09 |
| 8269480 |
Method and apparatus for identifying and reducing spurious frequency components |
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Testing a transceiver |
Timothy Burnett, Fengming Zhang, Harry Hou |
2010-12-07 |
| 6703825 |
Separating device response signals from composite signals |
William R. Creek, Mark Deome |
2004-03-09 |
| 6563298 |
Separating device response signals from composite signals |
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2003-05-13 |
| 6560756 |
Method and apparatus for distributed test pattern decompression |
Mark Deome, Dave Hollinbeck |
2003-05-06 |
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Timing generation in an automatic electrical test system |
Timothy Alton |
1994-05-10 |
| 5191295 |
Phase shift vernier for automatic test systems |
— |
1993-03-02 |
| 4647796 |
Multiple level voltage comparator circuit |
— |
1987-03-03 |
| 4594544 |
Participate register for parallel loading pin-oriented registers in test equipment |
— |
1986-06-10 |
| 4572971 |
Tri-state driver circuit for automatic test equipment |
— |
1986-02-25 |