Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6615391 | Current controlled multi-state parallel test for semiconductor device | Brian L. Brown, Jackson Leung, Ronald J. Syzdek | 2003-09-02 |
| 6408411 | Two pass multi-state parallel test for semiconductor device | Brian L. Brown, Jackson Leung, Ronald J. Syzdek | 2002-06-18 |
| 6381718 | Current controlled multi-state parallel test for semiconductor device | Brian L. Brown, Jackson Leung, Ronald J. Syzdek | 2002-04-30 |