Issued Patents All Time
Showing 1–25 of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7373562 | Memory circuit comprising redundant memory areas | — | 2008-05-13 |
| 7372749 | Methods for repairing and for operating a memory component | — | 2008-05-13 |
| 7372750 | Integrated memory circuit and method for repairing a single bit error | — | 2008-05-13 |
| 7359259 | Method for transmission and reception of a data signal on a line pair, as well as a transmission and reception circuit for this purpose | — | 2008-04-15 |
| 7349286 | Memory component and addressing of memory cells | — | 2008-03-25 |
| 7325182 | Method and circuit arrangement for testing electrical modules | — | 2008-01-29 |
| 7317248 | Memory module having memory chips protected from excessive heat | — | 2008-01-08 |
| 7298174 | Circuit and method for generating an output signal | — | 2007-11-20 |
| 7248067 | Semiconductor device with test circuit disconnected from power supply connection | — | 2007-07-24 |
| 7231488 | Self-refresh system and method for dynamic random access memory | — | 2007-06-12 |
| 7170798 | Controlled substrate voltage for memory switches | — | 2007-01-30 |
| 7162382 | Apparatus and method for calibrating signals | — | 2007-01-09 |
| 7134102 | Automated layout transformation system and method | — | 2006-11-07 |
| 7061408 | Concept for a secure data communication between electronic devices | — | 2006-06-13 |
| 6975550 | Array transistor amplification method and apparatus for dynamic random access memory | — | 2005-12-13 |
| 6947306 | Backside of chip implementation of redundancy fuses and contact pads | — | 2005-09-20 |
| 6940773 | Method and system for manufacturing DRAMs with reduced self-refresh current requirements | — | 2005-09-06 |
| 6922338 | Memory module with a heat dissipation means | — | 2005-07-26 |
| 6865707 | Test data generator | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Luepke, Jochen Mueller +1 more | 2005-03-08 |
| 6847571 | Use of redundant memory cells to manufacture cost efficient drams with reduced self refresh current capability | — | 2005-01-25 |
| 6744272 | Test circuit | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Luepke, Jochen Mueller +1 more | 2004-06-01 |
| 6711648 | Methods and apparatus for increasing data bandwidth in a dynamic memory device by generating a delayed address transition detection signal in response to a column address strobe signal | Yohji Watanabe | 2004-03-23 |
| 6674674 | Method for recognizing and replacing defective memory cells in a memory | — | 2004-01-06 |
| 6618305 | Test circuit for testing a circuit | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Luepke, Jochen Mueller +1 more | 2003-09-09 |
| 6522578 | Method for preventing electromigration in an MRAM | — | 2003-02-18 |