Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7112983 | Apparatus and method for single die backside probing of semiconductor devices | Darrell L. Miles, Richard W. Oldrey, John D. Sylvestri, Manuel J. Villalobos | 2006-09-26 |
| 7038474 | Laser-induced critical parameter analysis of CMOS devices | John D. Sylvestri | 2006-05-02 |