Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8916823 | Method and system for non-destructive distribution profiling of an element in a film | Bruno W. Schueler, David A. Reed, Michael Kwan, David S. Ballance | 2014-12-23 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8916823 | Method and system for non-destructive distribution profiling of an element in a film | Bruno W. Schueler, David A. Reed, Michael Kwan, David S. Ballance | 2014-12-23 |