Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8516430 | Test apparatus and circuit apparatus | — | 2013-08-20 |
| 8014969 | Test apparatus, test method and manufacturing method | Hirokatsu Niijima, Koji Hara, Kohei Shibata, Tetsuya Sakaniwa | 2011-09-06 |
| 6417682 | Semiconductor device testing apparatus and its calibration method | Toshikazu Suzuki, Hiroyuki Nagai, Yukio Ishigaki, Shigeru Matsumura, Takashi Sekizuka +3 more | 2002-07-09 |