Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11169023 | Optical measuring device, malfunction determination system, malfunction determination method, and a non-transitory recording medium storing malfunction | Koji Yamamoto, Masahiko Sakimoto, Akihiro Okayama, Satoshi Yokota, Norimasa Kubota | 2021-11-09 |
| 7549586 | Optical measurement system and sample optical property management method | Koji Watanabe, Toru Kobayashi, Masao Nakamuro | 2009-06-23 |
| 6088117 | Reflection characteristic measuring apparatus | Kenji Imura, Masayuki Makino, Wataru Yamaguchi, Hiroshi Kohsaka | 2000-07-11 |