Issued Patents All Time
Showing 25 most recent of 52 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11428631 | Method for measuring spectral radiation characteristics of fluorescence whitened sample, and device for measuring spectral radiation characteristics of fluorescence whitened sample | Yoshiroh Nagai | 2022-08-30 |
| 8767206 | Spectral characteristic measuring device, method for correcting spectral characteristic measuring device, and non-transitory computer readable recording medium | — | 2014-07-01 |
| 8502980 | Spectral characteristic measuring system, spectral characteristic measuring instrument, and data processing device | — | 2013-08-06 |
| 8345230 | Illumination apparatus and reflective characteristics measuring apparatus employing the same | — | 2013-01-01 |
| 8288739 | Method and apparatus for measuring optical property of fluorescent sample | — | 2012-10-16 |
| 8243261 | Optical property measurement apparatus | Takeshi Matsumoto, Shinji Yamamoto, Kazuya Kiyoi, Yoshiyuki Nagashima, Yasushi Goto | 2012-08-14 |
| 8130371 | Method of calibrating reflection characteristic measuring apparatus for sheet specimen | — | 2012-03-06 |
| 8115924 | Optical characteristic measuring apparatus | — | 2012-02-14 |
| 8064133 | Light receiving optical system, and spectrophotometer incorporated with the same | — | 2011-11-22 |
| 7973935 | Reflection characteristic measuring apparatus for sheet specimen and method of calibrating reflection characteristic measuring apparatus for sheet specimen | — | 2011-07-05 |
| 7916292 | Concave diffraction grating device, reflective dispersion device, and spectral device | Kenji Konno, Masayuki Yamada | 2011-03-29 |
| 7859663 | Polychrometer and method for correcting stray lights of the same | — | 2010-12-28 |
| 7852481 | Apparatus and method for measuring optical property | — | 2010-12-14 |
| 7719687 | Apparatus for measuring reflection characteristics of object surfaces | Jun Matsumoto, Yoshihiro Okui | 2010-05-18 |
| 7710559 | Calibration reference light source and calibration system using the same | — | 2010-05-04 |
| 7705983 | Wavelength displacement correcting system | Takeshi Matsumoto | 2010-04-27 |
| 7697136 | Reflection characteristic measuring apparatus, and method for calibrating reflection characteristic measuring apparatus | — | 2010-04-13 |
| 7675620 | Optical property measuring method and optical property measuring apparatus | — | 2010-03-09 |
| 7538870 | Multi-channel colorimeter and method for measuring spectral intensity characteristics | — | 2009-05-26 |
| 7502099 | Measuring method and apparatus for measuring an optical property of a fluorescent sample | — | 2009-03-10 |
| 7471391 | Method for calibrating spectral characteristics of a spectral analyzer and a spectral analyzer applying said method | — | 2008-12-30 |
| 7436516 | Reflection characteristic measuring apparatus | Yoshihiro Okui, Jun Matsumoto | 2008-10-14 |
| 7369239 | Light measuring apparatus and method for measuring monochromatic light | Yoshiyuki Nagashima, Shinji Shimizu, Katsutoshi Tsurutani | 2008-05-06 |
| 7369244 | Optical measuring apparatus, illumination system, and light detecting system | — | 2008-05-06 |
| 7365850 | Two-dimensional spectroradiometer | — | 2008-04-29 |