Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7953572 | Measurement system, and program product for measurement system | Toru Kobayashi | 2011-05-31 |
| 7675621 | Two-dimensional colorimeter, and spectral sensitivity correcting method | Keizou Ochi | 2010-03-09 |
| 7549586 | Optical measurement system and sample optical property management method | Koji Watanabe, Toru Kobayashi, Naoki Sagisaka | 2009-06-23 |
| 7385701 | Standard plane sample and optical characteristic measurement system | Koji Watanabe, Norio Ishikawa | 2008-06-10 |