Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9849562 | And manufacture of an abrasive polishing tool | Jaehee Sweeney, ChunSeob Hwang | 2017-12-26 |
| 7713404 | Monitoring apparatus and method for improving the accuracy and repeatability of electrochemical capacitance voltage (ECV) measurements | Ian Christopher Mayes, Harvey Podgorney, Clive Meaton | 2010-05-11 |
| 7446868 | Micro defects in semi-conductors | Victor Higgs, Ian Christopher Mayes, Freddie Yun Heng Chin | 2008-11-04 |
| 7113276 | Micro defects in semi-conductors | Victor Higgs, Ian Christopher Mayes, Freddie Yun Heng Chin | 2006-09-26 |