IM

Ian Christopher Mayes

NI Nanometrics Incorporated: 4 patents #21 of 127Top 20%
NO Nordson: 2 patents #420 of 1,063Top 40%
TS The University Of Sheffield: 1 patents #43 of 262Top 20%
GE: 1 patents #19,878 of 36,430Top 55%
Overall (All Time): #550,762 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11579058 Bond test apparatus and method for testing the strength of bonds on electrical circuitry 2023-02-14
9482605 Bond testing machine and cartridge for a bond testing machine comprising a plurality of test tools Robert Deards, Martin Bugg, David Lilley 2016-11-01
8680852 Method and apparatus for phase sensitive detection of eddy current measurements Alan Daly, Xiaoyu Qiao, John Hansen 2014-03-25
7842179 Sealing ring assembly and mounting method James J. Gough, Ian Gilbert, Harvey Podgorney 2010-11-30
7713404 Monitoring apparatus and method for improving the accuracy and repeatability of electrochemical capacitance voltage (ECV) measurements Michael Sweeney, Harvey Podgorney, Clive Meaton 2010-05-11
7556725 Sealing ring assembly and mounting method James J. Gough, Ian Gilbert, Harvey Podgorney 2009-07-07
7446868 Micro defects in semi-conductors Victor Higgs, Freddie Yun Heng Chin, Michael Sweeney 2008-11-04
7113276 Micro defects in semi-conductors Victor Higgs, Freddie Yun Heng Chin, Michael Sweeney 2006-09-26
5797114 Method and apparatus for mapping of semiconductor materials John Roberts, Ian Leslie Freeston, Richard Charles Tozer, Anthony Charles Gorvin, Francois Jean Djamdjl +1 more 1998-08-18