Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7589834 | Detection method and apparatus metal particulates on semiconductors | — | 2009-09-15 |
| 7446868 | Micro defects in semi-conductors | Ian Christopher Mayes, Freddie Yun Heng Chin, Michael Sweeney | 2008-11-04 |
| 7113276 | Micro defects in semi-conductors | Ian Christopher Mayes, Freddie Yun Heng Chin, Michael Sweeney | 2006-09-26 |
| 7098052 | Detection and classification of micro-defects in semi-conductors | — | 2006-08-29 |
| 6911347 | Method to detect surface metal contamination | — | 2005-06-28 |