Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10670649 | Bondwire testing of IC using pin diode signatures | Ronald Andrew Michallick, David Anthony White | 2020-06-02 |
| 10014810 | Reduced-impedance active current measurement | Ronald Andrew Michallick, David Anthony White | 2018-07-03 |
| 8947118 | Defect detection in integrated circuit devices | Ronald Andrew Michallick, Rex W. Pirkle | 2015-02-03 |